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Beilstein J. Nanotechnol. 2020, 11, 1644–1654, doi:10.3762/bjnano.11.147
Figure 1: Schematic of the procedure used in this work for extraction of amorphized length in phase-change me...
Figure 2: (a) Temperature profile used for annealing the as-fabricated amorphous devices to the crystalline p...
Figure 3: Schematic of the measurement sequence. One or more pulses were applied to initially reset the cryst...
Figure 4: Repeated post-reset pulses of 200 ns duration and 0.4 to 10.0 V amplitude (with an increment of 0.1...
Figure 5: Schematic illustration of the calculation of the amorphized length for two post-reset re-amorphizat...
Figure 6: (a) Approximate circuit model of an experimental setup with measured parasitic capacitance and resi...
Figure 7: (a) Logarithmic upward drift of the threshold field Ethreshold(t) for 25 identical cells [20,29] as a func...
Figure 8: Representative SEM images of six physically broken cells with lost connections, showing significant...